double DLTS

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Deep-level transient spectroscopy — (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in semiconductors. DLTS establishes fundamental defect parameters and measures their concentration in the material. Some of the parameters are … Wikipedia
Thermally stimulated current — (TSC) spectroscopy is an important technique used to study energy levels in semiconductors or insulators (organic or inorganic). Energy levels are first filled either by optical or electrical injection usually at a relatively low temperature,… … Wikipedia
List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy … Wikipedia

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